Home > News > Ascend claims breakthrough to simplify TAM analysis
September 29th, 2004
Ascend claims breakthrough to simplify TAM analysis
Abstract:
Ascend Instruments Inc. on Wednesday (Sept. 29) claimed to have devised a new technique that eliminates most of the steps in transmission electron microscopy (TAM), based on focused ion beam (FIB) technology.
Ascend Instruments
Source:
* siliconstrategies
Related News Press |
Announcements
What heat can tell us about battery chemistry: using the Peltier effect to study lithium-ion cells March 8th, 2024
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
Tools
Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||