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Home > News > Ascend claims breakthrough to simplify TAM analysis

September 29th, 2004

Ascend claims breakthrough to simplify TAM analysis

Abstract:
Ascend Instruments Inc. on Wednesday (Sept. 29) claimed to have devised a new technique that eliminates most of the steps in transmission electron microscopy (TAM), based on focused ion beam (FIB) technology.

Ascend Instruments

Source:
* siliconstrategies

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