Home > News > Microscope focuses on sub-Angstrom scales
September 16th, 2004
Microscope focuses on sub-Angstrom scales
Abstract:
Scientists have imaged a crystal on sub-Angstrom scales by exploiting a new technique to correct the aberrations in a scanning transmission electron microscope. Although microscopists realized 50 years ago that it would be possible to make these corrections, the technology needed to do this has only just been developed by researchers at the Oak Ridge National Laboratory in Tennessee and Nion, a company based in Washington state.
Source:
physicsweb
Related News Press |
Announcements
What heat can tell us about battery chemistry: using the Peltier effect to study lithium-ion cells March 8th, 2024
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
Tools
Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||