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Home > News > Microscope focuses on sub-Angstrom scales

September 16th, 2004

Microscope focuses on sub-Angstrom scales

Abstract:
Scientists have imaged a crystal on sub-Angstrom scales by exploiting a new technique to correct the aberrations in a scanning transmission electron microscope. Although microscopists realized 50 years ago that it would be possible to make these corrections, the technology needed to do this has only just been developed by researchers at the Oak Ridge National Laboratory in Tennessee and Nion, a company based in Washington state.

Source:
physicsweb

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