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Home > News > A Simpler Design for X-Ray Detectors

September 15th, 2004

A Simpler Design for X-Ray Detectors

A simplified design for ultra-sensitive X-ray detectors offering more precise materials analysis has been demonstrated at the National Institute of Standards and Technology (NIST). The advance is a step toward making such devices cheaper and easier to produce. Users may eventually include the semiconductor industry, which needs better X-ray detectors to identify and distinguish between nanoscale contaminant particles on silicon wafers.


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