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Home > News > KLA-Tencor and Seiko Instruments Partner

August 31st, 2004

KLA-Tencor and Seiko Instruments Partner

KLA-Tencor and SII NanoTechnology (SIINT), a subsidiary of Seiko Instruments, today announced they have formed a partnership to distribute SIINT's Nanopics 2100 high-speed, high-resolution atomic force profilometer to markets outside of Japan. Under the terms of the agreement, KLA-Tencor will sell the Nanopics 2100 as a joint product in North America and Europe with the full backing of its best-in-class system characterization and applications support—enabling broader access to this innovative surface metrology solution. The Nanopics 2100 is a compact tabletop system that combines the high resolution of an atomic force microscope (AFM) with the ease of use and speed of a surface profiler to enable non-destructive, absolute measurements of surface roughness, step height and surface contour. It is used to help ensure product quality for applications in a wide variety of industries, including data storage, semiconductor, and microelectromechanical systems (MEMS), as well as polymer science, optics, biotechnology, and general industrial research.


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