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Home > News > FEI demonstrates first dual beam microscope

August 10th, 2004

FEI demonstrates first dual beam microscope

Abstract:
Several leading R&D institutions, IITs, and industry representatives have lined themselves for a demonstration of a "full laboratory within the microscope" — the world's first dual beam scanning electron microscope — at the National Chemical Laboratory premises in the city.

Source:
timesofindia

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