Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > Zyvex Announces New IC Probing Application

April 2nd, 2004

Zyvex Announces New IC Probing Application

Abstract:
Zyvex Corporation today announced a breakthrough probing application for integrated circuit (IC) defect analysis. Zyvex enables rapid-response semiconductor device failure analysis at the contact level for better, faster, and cheaper IC development - features that are critical to the highly-competitive semiconductor industry.

Source:
PRNewswire

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Fine felted nanotubes : Research team of Kiel University develops new composite material made of carbon nanotubes November 22nd, 2017

Report highlights opportunities and risks associated with synthetic biology and bioengineering November 22nd, 2017

Quantum optics allows us to abandon expensive lasers in spectroscopy: Lomonosov Moscow State University scientists have invented a new method of spectroscopy November 21st, 2017

Nano-watch has steady hands November 21st, 2017

Tools

Nanometrics to Participate in the 6th Annual NYC Investor Summit 2017 November 16th, 2017

Nanometrics Announces $50 Million Share Repurchase Program November 15th, 2017

Nanometrics Board of Directors Names Pierre-Yves Lesaicherre President and CEO November 14th, 2017

Oxford Instruments announces winner of the 2017 Sir Martin Wood Prize for Japan November 14th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project