Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > New electron microscope enhances semiconductor analysis

December 10th, 2003

New electron microscope enhances semiconductor analysis

Offering improved resolution and significantly enhanced capabilities for semiconductor applications, Hitachi has introduced the HD-2300 scanning transmission electron microscope (STEM). The new instrument features a Schottky-type field emission source and has STEM resolution of 0.204 nm at an accelerating voltage of 200 kV.


Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press


Smashing metallic cubes toughens them up: Rice University scientists fire micro-cubes at target to change their nanoscale structures October 20th, 2016

EM Resolutions announce the availability of Kleindiek Nanotechnik’s new cryo microgripper for cryo-FIB lift-out October 18th, 2016

The University of Applied Sciences in Upper Austria uses Deben tensile stages as an integral part of their computed tomography research and testing facility October 18th, 2016

Crystal clear imaging: Infrared brings to light nanoscale molecular arrangement: Berkeley Lab and University of Colorado-Boulder team develop new way to reveal crystal features in functional materials October 17th, 2016

The latest news from around the world, FREE

  Premium Products
Only the news you want to read!
 Learn More
University Technology Transfer & Patents
 Learn More
Full-service, expert consulting
 Learn More

Nanotechnology Now Featured Books


The Hunger Project