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Home > News > New Look At Layered Material Lends Insight To Silicon

December 2nd, 2003

New Look At Layered Material Lends Insight To Silicon

Abstract:
Engineers at Ohio State University and their colleagues have taken an unprecedented look at the interface between layers of silicon and other materials in electronic devices. What they have learned may help traditional microelectronics remain vital to industry longer than most experts expect. It may even aid the design of other devices where one material meets another -- including medical implants.

Source:
SpaceDaily

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