Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button


Home > News > X-ray inspection may meet computer chip-making need

November 21st, 2003

X-ray inspection may meet computer chip-making need

A decades-old, X-ray-based method for studying the atomic structure of materials may be the answer to a looming semiconductor industry need - a rugged, high-throughput technology for measuring dimensions of chip circuitry packed with devices approaching molecular proportions. A team led by NIST scientists recently reported* their initial success in adapting small-angle X-ray scattering (SAXS) to rapidly characterize the size and shape of grid-like patterns with nanometer-scale linewidths. With better than one nanometer precision, the team determined the average size of periodically repeating features arrayed on three chemically different samples much like the intricately patterned polymer masks used to print integrated-circuit designs.


Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Chip Technology

Global leader in semiconductor technology to maintain and expand operations at SUNY Poly CNSE in Albany October 8th, 2015

Purdue launching new quantum center during workshop October 8th, 2015

Leti Joins GLOBALFOUNDRIES’ Eco-System Partners With Focus on Supporting 22FDX™ Platform: GLOBALSOLUTIONSSM Partnership Will Enable Leti’s FD-SOI and ASICS Design-and-Fabrication Solutions on GLOBALFOUNDRIES Technologies October 7th, 2015

Double the (quantum) fun: A detailed analysis of the electrical characteristics of a tiny transistor made from 2 quantum dots could help researchers design better devices to manipulate single electrons October 7th, 2015


Oxford Instruments announces call for nominations for the 2016 Science Prizes for Europe and Americas October 7th, 2015

Organic semiconductors get weird at the edge: University of British Columbia research October 7th, 2015

Electron tomography with 3,487 images in 3.5 seconds: High-speed electron tomography sets new standards for 3-D images of the nanoworld October 6th, 2015

Rice news release: Smaller is better for nanotube analysis: Rice University's variance spectroscopy technique advances nanoparticle analysis September 30th, 2015

The latest news from around the world, FREE

  Premium Products
Only the news you want to read!
 Learn More
University Technology Transfer & Patents
 Learn More
Full-service, expert consulting
 Learn More

Nanotechnology Now Featured Books


The Hunger Project

Car Brands
Buy website traffic