Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > News > AFM indenter makes holes for nanocontacts

October 24th, 2003

AFM indenter makes holes for nanocontacts

Abstract:
Researchers in France and Belgium have used a conducting-tip atomic force microscope (CTAFM) to create nanocontacts with areas of less than 10 square nm. The scientists, from Unité Mixte de Physique CNRS/Thales, France, the University of Evry, France, and the University of Louvain-La-Neuve in Belgium, controlled the nanocontact formation by measuring the resistance between the conductive tip of the AFM and a conductive sample covered with an insulating layer.

Source:
Nanotechweb

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Tools

Breakthrough in ALD-graphene by Picosun technology October 1st, 2014

Novel approach to magnetic measurements atom-by-atom October 1st, 2014

Stressed Out: Research Sheds New Light on Why Rechargeable Batteries Fail October 1st, 2014

Yale University and Leica Microsystems Partner to Establish Microscopy Center of Excellence: Yale Welcomes Scientists to Participate in Core Facility Opening and Super- Resolution Workshops October 20 Through 31, 2014 September 30th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE