Home > News > AFM indenter makes holes for nanocontacts
October 24th, 2003
AFM indenter makes holes for nanocontacts
Researchers in France and Belgium have used a conducting-tip atomic force microscope (CTAFM) to create nanocontacts with areas of less than 10 square nm. The scientists, from Unité Mixte de Physique CNRS/Thales, France, the University of Evry, France, and the University of Louvain-La-Neuve in Belgium, controlled the nanocontact formation by measuring the resistance between the conductive tip of the AFM and a conductive sample covered with an insulating layer.
Atomic-Scale Investigations Solve Key Puzzle of LED Efficiency: MIT and Brookhaven Lab scientists use electron microscopy imaging techniques to settle a solid-state controversy and raise new experimental possibilities May 22nd, 2013
Xmark Media announces the 2013 Vacuum Expo & Vacuum Symposium, Ricoh Arena - Coventry 16-17 October May 21st, 2013
JPK reports on single molecule research at IISER Pune in India using AFM and CellHesion techniques May 21st, 2013
Penn engineers' nanoantennas improve infrared sensing May 20th, 2013