Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > AFM indenter makes holes for nanocontacts

October 24th, 2003

AFM indenter makes holes for nanocontacts

Researchers in France and Belgium have used a conducting-tip atomic force microscope (CTAFM) to create nanocontacts with areas of less than 10 square nm. The scientists, from Unité Mixte de Physique CNRS/Thales, France, the University of Evry, France, and the University of Louvain-La-Neuve in Belgium, controlled the nanocontact formation by measuring the resistance between the conductive tip of the AFM and a conductive sample covered with an insulating layer.


Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press


Imaging technique pulls plasmon data together: Rice University scientists' hyperspectral method analyzes many plasmonic nanoparticles in an instant March 16th, 2018

Movable silicon 'lenses' enable neutrons to see new range of details inside objects March 15th, 2018

Jim Barnhart Joins Nanometrics as Senior Vice President of Operations March 15th, 2018

Department of Materials Test Engineering (WPT) at TU Dortmund University uses Deben CT5000TEC stage to perform X-ray micro-tomography experiments for better understanding of damage progression in composite materials March 13th, 2018

The latest news from around the world, FREE

  Premium Products
Only the news you want to read!
 Learn More
Full-service, expert consulting
 Learn More

Nanotechnology Now Featured Books


The Hunger Project