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October 24th, 2003
AFM indenter makes holes for nanocontacts
Researchers in France and Belgium have used a conducting-tip atomic force microscope (CTAFM) to create nanocontacts with areas of less than 10 square nm. The scientists, from Unité Mixte de Physique CNRS/Thales, France, the University of Evry, France, and the University of Louvain-La-Neuve in Belgium, controlled the nanocontact formation by measuring the resistance between the conductive tip of the AFM and a conductive sample covered with an insulating layer.
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