Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > News > NIST Helps Chip Industry Measure Features by Counting Atoms

August 14th, 2003

NIST Helps Chip Industry Measure Features by Counting Atoms

Abstract:
The quest to develop the nanotechnology equivalent of rulers—length-measurement references based on the spacing of atoms in a perfectly ordered crystal—has inspired a burst of innovation at the National Institute of Standards and Technology (NIST). Progress to date has yielded a novel device that can resolve distances smaller than the radius of an atom and a reliable method for writing 10-nanometer-sized features on silicon. (More on NIST and Semiconductors)

Source:
NIST

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Tools

Better battery imaging paves way for renewable energy future April 20th, 2015

Nondestructive 3-D Imaging of Biological Cells with Sound April 20th, 2015

Oxford Instruments commissions high field outsert magnet system for the National High Magnetic Field Laboratory 32 Tesla magnet program April 17th, 2015

Lanthanide-Organic Framework Nanothermometers Prepared by Spray-Drying April 16th, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project