Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > News > NIST Helps Chip Industry Measure Features by Counting Atoms

August 14th, 2003

NIST Helps Chip Industry Measure Features by Counting Atoms

Abstract:
The quest to develop the nanotechnology equivalent of rulers—length-measurement references based on the spacing of atoms in a perfectly ordered crystal—has inspired a burst of innovation at the National Institute of Standards and Technology (NIST). Progress to date has yielded a novel device that can resolve distances smaller than the radius of an atom and a reliable method for writing 10-nanometer-sized features on silicon. (More on NIST and Semiconductors)

Source:
NIST

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Tools

Ultra-Low Frequency Vibration Isolation Stabilizes Scanning Tunneling Microscopy at UCLA’s Nano-Research Group August 28th, 2014

Measure Both Elastic and Viscous Properties with AFM Using Asylum Research’s Exclusive AM-FM Viscoelastic Mapping Mode August 28th, 2014

Malvern specialists to deliver inaugural short course on polymer characterization at Interplas 2014 August 27th, 2014

Scientists craft atomically seamless, thinnest-possible semiconductor junctions August 26th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE