Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > News > NIST Helps Chip Industry Measure Features by Counting Atoms

August 14th, 2003

NIST Helps Chip Industry Measure Features by Counting Atoms

Abstract:
The quest to develop the nanotechnology equivalent of rulers—length-measurement references based on the spacing of atoms in a perfectly ordered crystal—has inspired a burst of innovation at the National Institute of Standards and Technology (NIST). Progress to date has yielded a novel device that can resolve distances smaller than the radius of an atom and a reliable method for writing 10-nanometer-sized features on silicon. (More on NIST and Semiconductors)

Source:
NIST

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Tools

Visualizing interacting electrons in a molecule: Scientists at Aalto University and the University of Zurich have succeeded in directly imaging how electrons interact within a single molecule January 26th, 2015

Graphene brings quantum effects to electronic circuits January 22nd, 2015

EnvisioNano: An image contest hosted by the National Nanotechnology Initiative (NNI) January 22nd, 2015

New Molecular Beam Epitaxy deposition equipment at the ICN2 January 22nd, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2015 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE