Home > News > Measuring invisible reflections
July 25th, 2003
Measuring invisible reflections
Beams with a wavelength of around 13 nanometers, like their close relatives, x-rays, can neither be reflected nor focused with conventional optical systems. One solution is to use curved mirrors that - unlike those in your bathroom - are coated with hundreds of alternating layers of different materials. Each layer reflects a small part of the radiation. Researchers at the Fraunhofer Institute for Material and Beam Technology IWS rejoiced last year when they broke the 70-percent reflectivity barrier.
Strengthening thin-film bonds with ultrafast data collection October 23rd, 2014
NIST offers electronics industry 2 ways to snoop on self-organizing molecules October 22nd, 2014
Materials for the next generation of electronics and photovoltaics: MacArthur Fellow develops new uses for carbon nanotubes October 21st, 2014
Nitrogen Doped Graphene Characterized by Iranian, Russian, German Scientists October 21st, 2014