Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > Measuring invisible reflections

July 25th, 2003

Measuring invisible reflections

Abstract:
Beams with a wavelength of around 13 nanometers, like their close relatives, x-rays, can neither be reflected nor focused with conventional optical systems. One solution is to use curved mirrors that - unlike those in your bathroom - are coated with hundreds of alternating layers of different materials. Each layer reflects a small part of the radiation. Researchers at the Fraunhofer Institute for Material and Beam Technology IWS rejoiced last year when they broke the 70-percent reflectivity barrier.

Source:
* AlphaGalileo

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Chip Technology

UCLA chemists synthesize narrow ribbons of graphene using only light and heat: Tiny structures could be next-generation solution for smaller electronic devices December 8th, 2017

Device makes power conversion more efficient: New design could dramatically cut energy waste in electric vehicles, data centers, and the power grid December 8th, 2017

Leti Integrates Hybrid III-V Silicon Lasers on 200mm Wafers with Standard CMOS Process December 6th, 2017

Leti Breakthroughs Point Way to Significant Improvements in SoC Memories December 6th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project