Nanotechnology Now

• About Us
  
  • Advertising
  • Our Mission
  • Our Team
  • Comments
  • Friends
  • Contact
• Nanotechnology
• News
  
  • Current News
  • Press Releases
  • Submit Press
  • Press kit
  • Interviews
• Columns
• Products
  
  • Our Products
  • Books
  • Featured Books
• Directories
  
  • Companies/Academic
  • Events
  • Glossary
  • Best Of
• Career Center
• Nano-Social Network
• Nano Consulting
• My Account

Home > News > Measuring invisible reflections

July 25th, 2003

Measuring invisible reflections

Abstract:
Beams with a wavelength of around 13 nanometers, like their close relatives, x-rays, can neither be reflected nor focused with conventional optical systems. One solution is to use curved mirrors that - unlike those in your bathroom - are coated with hundreds of alternating layers of different materials. Each layer reflects a small part of the radiation. Researchers at the Fraunhofer Institute for Material and Beam Technology IWS rejoiced last year when they broke the 70-percent reflectivity barrier.

Source:
* AlphaGalileo

Bookmark:

Related News Press

Chip Technology

Imec and GLOBALFOUNDRIES collaborate to advance high-density memory technology: STT-MRAM offers enhanced performance and scalability for embedded and standalone applications May 21st, 2013

Penn engineers' nanoantennas improve infrared sensing May 20th, 2013

UC Riverside scientists discovering new uses for tiny carbon nanotubes: Adding ionic liquid to nanotube films could build smaller gadgets, and create more cost effective 'Smart Windows' that darken in bright sun May 15th, 2013

Nanometrics Announces Upcoming Investor Events May 14th, 2013