Home > News > Ultratech rolls out metrology tool for MEMS, ICs
June 18th, 2003
Ultratech rolls out metrology tool for MEMS, ICs
Ultratech entered the metrology market with a tool designed for semiconductor and nanotechnology applications. The new UltraMet 100 is a metrology system designed to measure any, or every, die on a wafer, providing full-wafer validation of Ultratech's Nanotech 160 dual-side-alignment stepper. The tool is designed for chip and MEMS systems.
Hiden Gas Analysers at PITTCON 2015 | Visit us on Booth No. 1127 January 29th, 2015
Advantest to Exhibit at SEMICON Korea in Seoul, South Korea February 4-6 Showcasing Broad Portfolio of Semiconductor Products, Technologies and Solutions January 29th, 2015
Park Systems Announces Innovations in Bio Cell Analysis with the Launch of Park NX-Bio, the only 3-in-1 Imaging Nanoscale Tool Available for Life Science Researchers January 29th, 2015
2015 Nanonics Image Contest January 29th, 2015