Home > News > Ultratech rolls out metrology tool for MEMS, ICs
June 18th, 2003
Ultratech rolls out metrology tool for MEMS, ICs
Ultratech entered the metrology market with a tool designed for semiconductor and nanotechnology applications. The new UltraMet 100 is a metrology system designed to measure any, or every, die on a wafer, providing full-wafer validation of Ultratech's Nanotech 160 dual-side-alignment stepper. The tool is designed for chip and MEMS systems.
NanoInk, Inc. Assets To Be Sold May 18th, 2013
Beautiful "flowers" self-assemble in a beaker: Elaborate nanostructures blossom from a chemical reaction perfected at Harvard May 17th, 2013
Scientists capture first direct proof of Hofstadter butterfly effect May 17th, 2013
DNA-Guided Assembly Yields Novel Ribbon-Like Nanostructures: Approach could be useful in fabricating new kinds of materials with engineered properties May 16th, 2013