Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > Ultratech rolls out metrology tool for MEMS, ICs

June 18th, 2003

Ultratech rolls out metrology tool for MEMS, ICs

Abstract:
Ultratech entered the metrology market with a tool designed for semiconductor and nanotechnology applications. The new UltraMet 100 is a metrology system designed to measure any, or every, die on a wafer, providing full-wafer validation of Ultratech's Nanotech 160 dual-side-alignment stepper. The tool is designed for chip and MEMS systems.

Source:
* SiliconStrategies

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Tools

The relationship between charge density waves and superconductivity? It's complicated July 19th, 2018

Oxford Instrumentsí 22 Tesla superconducting magnet system commissioned at the UAM, making it the most intense magnetic field available outside a large international facility July 12th, 2018

Nanometrics to Announce Second Quarter Financial Results on July 31, 2018 July 12th, 2018

Nanometrics to Participate in the 10th Annual CEO Investor Summit 2018: Accredited investor and publishing research analyst event held concurrently with SEMICON West and Intersolar 2018 in San Francisco June 28th, 2018

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project