Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > News > New sensor bares faults in smallest possible, most advanced circuits

May 12th, 2003

New sensor bares faults in smallest possible, most advanced circuits

Abstract:
A new scanning microscope developed at Brown University can uncover defects in the smallest and most complex integrated circuits at a resolution 1,000 times greater than current technology. The scanner removes a barrier to further shrinking of integrated circuits: As circuits get smaller, non-visual defects become harder to find.

Source:
EurekAlert

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Tools

So, near and yet so far: Stable HGNs for Raman April 1st, 2015

PIHera: Largest Family of Piezo Stage Scanners with 10X Greater Positioning Area March 31st, 2015

New Applications Brochure on Complex Motion Control Systems for Scientific Research March 31st, 2015

'Atomic chicken-wire' is key to faster DNA sequencing March 30th, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2015 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE