Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > FEI Announces Multiple Orders for 3D Metrology Systems

April 24th, 2003

FEI Announces Multiple Orders for 3D Metrology Systems

Abstract:
FEI Company today announced that it has received multiple
orders for its Certus 3D(TM), FEI's latest in-line DualBeam(TM) system
designed to support new process nodes for the next generation of advanced
thin-film heads. The Certus 3D was engineered with input from FEI's data
storage customers as they prepared to transition to new process nodes
requiring greater precision at feature sizes down to 40 nm.

Source:
PRNewswire

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Investments/IPO's/Splits

Nanotech Grants Options September 22nd, 2016

Arrowhead Pharmaceuticals to Present at Upcoming September Conferences September 1st, 2016

Industrial Nanotech, Inc. Provides Shareholder Update August 22nd, 2016

Carbodeon Ltd Oy Closes EUR 1.5 million Funding Round From Straightforward Capital: Carbodeon will accelerate its nanodiamonds business and expand manufacturing capacity August 21st, 2016

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic