Nanotechnology Now

• About Us
  
  • Advertising
  • Our Mission
  • Our Team
  • Comments
  • Friends
  • Contact
• Nanotechnology
• News
  
  • Current News
  • Press Releases
  • Submit Press
  • Press kit
  • Interviews
• Columns
• Products
  
  • Our Products
  • Books
  • Featured Books
• Directories
  
  • Companies/Academic
  • Events
  • Glossary
  • Best Of
• Career Center
• Nano-Social Network
• Nano Consulting
• My Account

Home > News > NIST, HP Move Toward Critical Molecular Electronics Measurements

April 2nd, 2003

NIST, HP Move Toward Critical Molecular Electronics Measurements

Abstract:
Researchers at the National Institute of Standards and Technology and Hewlett Packard Laboratories will report this week that they are progressing toward reliable methods for measuring the electrical behavior of molecular electronic devices, an infant nanotechnology eyed for future integrated circuits.

Source:
NIST

Bookmark:

Related News Press

Tools

Heinrich Rohrer dies at 79; a father of nanotechnology: With IBM colleague Gerd Binnig, Rohrer invented the scanning tunneling microscope, which can show individual atoms on a surface and move them around May 23rd, 2013

Gold nanocrystal vibration captured on billion-frames-per-second film May 23rd, 2013

Precision Positioning Systems go Nano: New Miniaturized Piezo-Motor Driven Nanopositioning Stage by PI May 22nd, 2013

Researchers Stitch Defects into the World’s Thinnest Semiconductor May 22nd, 2013