Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > New material research possibilities with AFM

February 3rd, 2003

New material research possibilities with AFM

Abstract:
WITec has introduced a fully digital pulsed force mode (PFM) for atomic force microscopy (AFM). New material properties formerly inaccessible with AFM can now be analyzed and imaged simultaneously with the topography.

Source:
WITec

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Tools

Iranian Firm Offering Nano-Products on Chinese Market October 16th, 2018

Big award enables study of small surfaces: Rice U.'s Matt Jones wins Packard Fellowship to view nanoscale chemical reactions October 15th, 2018

Nanometrics to Announce Third Quarter Financial Results on October 30, 2018 October 10th, 2018

UCI scientists push microscopy to sub-molecular resolution: Carbon monoxide used to measure electric forces in single chemical compound October 2nd, 2018

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project